1A2P
BARNASE WILDTYPE STRUCTURE AT 1.5 ANGSTROMS RESOLUTION
X-RAY DIFFRACTION
Crystallization
Crystalization Experiments | ||||
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ID | Method | pH | Temperature | Details |
1 | 7.5 | pH 7.5 |
Crystal Properties | |
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Matthews coefficient | Solvent content |
2.24 | 45 |
Crystal Data
Unit Cell | |
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Length ( Å ) | Angle ( ˚ ) |
a = 58.97 | α = 90 |
b = 58.97 | β = 90 |
c = 81.58 | γ = 120 |
Symmetry | |
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Space Group | P 32 |
Diffraction
Diffraction Experiment | ||||||||||||||
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ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
1 | 1 | x-ray | 287 | IMAGE PLATE | MARRESEARCH | MULTILAYER MIRROR | 1993-11-06 | M |
Radiation Source | |||||
---|---|---|---|---|---|
ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
1 | SYNCHROTRON | LURE BEAMLINE DW32 | LURE | DW32 |
Data Collection
Overall | |||||||||||||||||||
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Sym I (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | ||||||||
1 | 1.5 | 19.9 | 96.9 | 0.038 | 11.9 | 2.5 | 48463 |
Highest Resolution Shell | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R-Sym I (Observed) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | |||||||||||
1.5 | 1.58 | 94.5 | 0.158 | 4.7 | 1.9 |
Refinement
Statistics | |||||||||||||||||||
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Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Number Reflections (All) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (All) | R-Factor (Observed) | R-Work | R-Free | R-Free Selection Details | Mean Isotropic B | ||||||
X-RAY DIFFRACTION | FREE R-VALUE | 1.5 | 8 | 48118 | 4812 | 95.4 | 0.115 | 0.111 | 0.174 | EVERY 10TH REFLECTION |
Temperature Factor Modeling | ||||||
---|---|---|---|---|---|---|
Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
Coordinate Error | ||
---|---|---|
Structure Solution Method | Refinement High Resolution | Refinement Low Resolution |
10 | 2417.5 | 2972 |
RMS Deviations | |
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Key | Refinement Restraint Deviation |
s_angle_d | 1.76 |
s_zero_chiral_vol | 0.273 |
s_non_zero_chiral_vol | 0.2 |
s_anti_bump_dis_restr | 0.1 |
s_approx_iso_adps | 0.1 |
s_similar_adp_cmpnt | 0.064 |
s_bond_d | 0.013 |
s_rigid_bond_adp_cmpnt | 0.01 |
s_similar_dist | |
s_from_restr_planes |
Non-Hydrogen Atoms Used in Refinement | |
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Non-Hydrogen Atoms | Number |
Protein Atoms | 2624 |
Nucleic Acid Atoms | |
Solvent Atoms | 415 |
Heterogen Atoms | 3 |
Software
Software | |
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Software Name | Purpose |
SHELXL-93 | model building |
X-PLOR | model building |
SHELXL-93 | refinement |
X-PLOR | refinement |
MOSFLM | data reduction |
CCP4 | data scaling |
SHELXL-93 | phasing |
X-PLOR | phasing |